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Analysis of photoinduced current transient spectroscopy (PICTS) data by a regularisation method: Application of compensation defects in CdTe

✍ Scribed by C. Eiche; D. Maier; J. Weese; K. W. Benz


Book ID
111997802
Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
396 KB
Volume
3
Category
Article
ISSN
1616-301X

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