Analysis of non-catastrophic failures in electronic devices due to random noise : C. Prakash. Microelectron. Reliab. 16, 587 (1977)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 127 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)91018-1