✦ LIBER ✦
Analysis of nitride storage non-volatile memories with HfSiOx blocking dielectric and TiN metal gate for low power embedded applications
✍ Scribed by Dušan S. Golubović; Michiel J. van Duuren; Nader Akil; Antonio Arreghini; Francesco Driussi
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 851 KB
- Volume
- 86
- Category
- Article
- ISSN
- 0167-9317
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