Analysis of negative differential conductance of single-island single-electron transistors owing to Coulomb oscillations

✍ Scribed by Sui, B.; Fang, L.; Chi, Y.; Zhang, C.

• Book ID: 114442545
• Publisher: The Institution of Engineering and Technology
• Year: 2010
• Tongue: English
• Weight: 783 KB
• Volume: 4
• Category: Article
• ISSN: 1751-858X
• DOI: 10.1049/iet-cds.2009.0247