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Analysis of mode quality factors and mode reflectivities for nanowire cavity by FDTD technique

✍ Scribed by Miao-Qing Wang; Yong-Zhen Huang; Qin Chen; Zhi-Ping Cai


Book ID
118696273
Publisher
IEEE
Year
2006
Tongue
English
Weight
328 KB
Volume
42
Category
Article
ISSN
0018-9197

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