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Analysis of mode coupling due to spherical defects in ideal fully metal-coated scanning near-field optical microscopy probes

✍ Scribed by Nakagawa, Wataru; Vaccaro, Luciana; Herzig, Hans Peter


Book ID
115390534
Publisher
Optical Society of America
Year
2006
Tongue
English
Weight
765 KB
Volume
23
Category
Article
ISSN
1084-7529

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