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Analysis of minute strain fields around A-swirl defects in a float zone silicon crystal by means of plane wave X-ray topography using extremely collimated X-rays

✍ Scribed by Shigeru Kimura; Tetsuya Ishikawa; Jun'ichiro Mizuki; Junji Matsui


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
441 KB
Volume
116
Category
Article
ISSN
0022-0248

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