✦ LIBER ✦
Analysis of long term reliability of plated-through holes in multilayer interconnection boards Part B: Fatigue results and fracture mechanisms
✍ Scribed by K.S. Vecchio; R.W. Hertzberg
- Publisher
- Elsevier Science
- Year
- 1986
- Tongue
- English
- Weight
- 934 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0026-2714
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