Analysis of I–V measurements on PtSi-Si Schottky structures in a wide temperature range

✍ Scribed by D. Donoval; M. Barus; M. Zdimal

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 488 KB
• Volume: 34
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(91)90031-s