✦ LIBER ✦
Analysis of integrated circuit failure modes and failure mechanisms derived from high temperature operating life tests : R. A. Vetter. IEEE 11th Annual Proceedings Reliability Physics (1973). p. 133
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 108 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0026-2714
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