✦ LIBER ✦
Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile
✍ Scribed by I. Cortés; J. Roig; D. Flores; J. Urresti; S. Hidalgo; J. Rebollo
- Book ID
- 104057808
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 513 KB
- Volume
- 45
- Category
- Article
- ISSN
- 0026-2714
No coin nor oath required. For personal study only.