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Analysis of hard carbon for lithium-ion batteries by hard X-ray photoelectron spectroscopy

✍ Scribed by Hori, Hironobu; Shikano, Masahiro; Kobayashi, Hironori; Koike, Shinji; Sakaebe, Hikari; Saito, Yoshiyasu; Tatsumi, Kuniaki; Yoshikawa, Hideki; Ikenaga, Eiji


Book ID
123228133
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
452 KB
Volume
242
Category
Article
ISSN
0378-7753

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## Abstract We carried out nondestructive measurements of the depth profile of etching‐induced damage in p‐type gallium nitride (p‐GaN), in particular surface band bending, using Hard X‐ray Photoelectron Spectroscopy (HAX‐PES). HAX‐PES at different take‐off angles of photoelectrons made it clear th