Total Reflection X-Ray Fluorescence Anal
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R. Görgl; P. Wobrauschek; P. Kregsamer; Ch. Streli; M. Haller; A. Knöchel; M. Ra
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Article
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1997
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John Wiley and Sons
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English
⚖ 341 KB
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The use of synchrotron radiation as the excitation source for total reÑection x-ray Ñuorescence analysis (SR-TXRF) in combination with a multilayer structure for monochromatization led to detection limits in the femtogram range for medium-Z elements. Experiments were performed at the Hasylab Beamlin