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Analysis of extended defects in melt-grown GaSe single crystals by convergent-beam electron diffraction techniques

✍ Scribed by C. De Blasi; D. Manno

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 743 KB
Volume: 35
Category: Article
ISSN: 0304-3991
DOI: 10.1016/0304-3991(91)90092-k

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