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Analysis of ESD protection networks for DMOS power transistors by means of static and time-resolved emission microscopy

✍ Scribed by Bruno Bonati; Athos Canclini; Marianna Cavone; Enrico Novarini; Paolo Pavan; Roberto Rivoir; Michele Stucchi; Enrico Zanoni


Book ID
112184874
Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
474 KB
Volume
9
Category
Article
ISSN
0748-8017

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