Analysis of epitaxial layer thickness variability in the fabrication of high performance bipolar transistors : D. P. Kennedy and P. C. Murley. Solid St. Electron. 15 (1972), p. 203

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 114 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90524-0