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Analysis of epitaxial CdxHg1 − xTe layers using RBS, SIMS and EER

✍ Scribed by D. J. Diskett; A. J. Avery; G. Blackmore; S. J. C. Irvine; J. Giess; L. E. A. Berlouis

Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
519 KB
Volume
14
Category
Article
ISSN
0142-2421

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📜 SIMILAR VOLUMES

Conductivity and Hall coefficient of gra
Conductivity and Hall coefficient of graded-composition epitaxial CdxHg1−xTe layers
📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 158 KB

Classified abstracts 3418-3429 resolved by taking into account the differences concerning the film orientations. (Germany) W Keune et al, J Appl Phys, 48 (7), 1977,2976-2979. 30 3418. Optid properties of arc-evaporated carbon fdm9 between G and 3.8 eV. (USA) Ellipsometric measurements have been perf