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Analysis of electrically active N–O complexes in nitrogen-doped CZ silicon crystals by FTIR spectroscopy

✍ Scribed by H. Ch. Alt; Y.V. Gomeniuk; F. Bittersberger; A. Kempf; D. Zemke


Book ID
104064249
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
125 KB
Volume
9
Category
Article
ISSN
1369-8001

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