Analysis of electrical characteristics of Au/SiO2/n-Si (MOS) capacitors using the high–low frequency capacitance and conductance methods

✍ Scribed by A. Tataroğlu; Ş. Altındal

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 235 KB
• Volume: 85
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2008.07.001