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Analysis of displacement damage effects on MOS capacitors

✍ Scribed by Fernández-Martínez, P.; Palomo, F.R.; Hidalgo, S.; Fleta, C.; Campabadal, F.; Flores, D.


Book ID
120556742
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
611 KB
Volume
730
Category
Article
ISSN
0168-9002

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