Analysis of defects in microcrystalline islands in amorphous silicon films with a Scanning Charge-Transient Microscope

✍ Scribed by Š. Lányi; V. Nádaždy

• Book ID: 108291723
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 433 KB
• Volume: 107
• Category: Article
• ISSN: 0304-3991
• DOI: 10.1016/j.ultramic.2007.04.014