Analysis of Defect-Related Localized Emission Processes in InGaN/GaN-Based LEDs

✍ Scribed by Meneghini, M.; Vaccari, S.; Trivellin, N.; Dandan Zhu; Humphreys, C.; Butendheich, R.; Leirer, C.; Hahn, B.; Meneghesso, G.; Zanoni, E.

• Book ID: 114620919
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 844 KB
• Volume: 59
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2012.2186970