Analysis of defect-assisted tunneling based on low frequency noise measurements of resonant tunnel diodes

✍ Scribed by M.H. Weichold; S.S. Villareal; R.A. Lux

• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 310 KB
• Volume: 32
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(89)90272-4