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Analysis of Data Obtained Using the Thermal-Step Method on a MOS Structure—An Electrostatic Approach

✍ Scribed by Boyer, L.; Fruchier, O.; Notingher, P.; Agnel, S.; Toureille, A.; Rousset, B.; Sanchez, J.-L.


Book ID
117917927
Publisher
IEEE
Year
2010
Tongue
English
Weight
738 KB
Volume
46
Category
Article
ISSN
0093-9994

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