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Analysis of Confidence Lower Limits of Reliability and Hazard Rate for Electronic Stability Control Systems

✍ Scribed by Shiwen Niu; Wei Zhan

Book ID: 112184059
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 262 KB
Volume: 29
Category: Article
ISSN: 0748-8017
DOI: 10.1002/qre.1380

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