Analysis of asymmetric Z-scan measurement for large optical nonlinearities in an amorphous As_2S_3 thin film

✍ Scribed by Kwak, Chong Hoon; Lee, Yeung Lak; Kim, Seong Gyu

• Book ID: 115395791
• Publisher: Optical Society of America
• Year: 1999
• Tongue: English
• Weight: 210 KB
• Volume: 16
• Category: Article
• ISSN: 0740-3224
• DOI: 10.1364/JOSAB.16.000600