✦ LIBER ✦

Analysis of Artifacts in Subpixel Remote Sensing Image Registration

✍ Scribed by Inglada, J.; Muron, V.; Pichard, D.; Feuvrier, T.

Book ID: 114626156
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 728 KB
Volume: 45
Category: Article
ISSN: 0196-2892
DOI: 10.1109/tgrs.2006.882262

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