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Analysis of Application of the IDDQ Technique to the Deep Sub-Micron VLSI Testing

โœ Scribed by Chih-Wen Lu; Chung Len Lee; Chauchin Su; Jwu-E Chen


Book ID
110324118
Publisher
Springer US
Year
2002
Tongue
English
Weight
96 KB
Volume
18
Category
Article
ISSN
0923-8174

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