𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Analysis of Antarctic Marine Sediment by Inductively Coupled Plasma Atomic Emission and Total Reflection X-Ray Fluorescence Spectrometry

✍ Scribed by T. Gasparics; I. Csató; Gy. Záray

Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
79 KB
Volume
55
Category
Article
ISSN
0026-265X

No coin nor oath required. For personal study only.

✦ Synopsis

Microwave digestion and extraction techniques were developed for elemental analysis of Antarctic marine sediment by inductively coupled plasma atomic emission spectrometry (ICP-AES) and total reflection X-ray fluorescence (TXRF) spectrometry. These sample preparation techniques were tested by analyzing river sediment certified reference material (BCR-320). Concentrations of Al, Fe, Mn, Zn, Cr, Co, and Cu were determined by ICP-AES after microwave digestion of sediment in a mixture of HF / HNO 3 / HCl / H 3 BO 3 with acceptable accuracy. Due to the strong matrix effect and spectral interference, Cd, Sn, Pb, Ni, and As cannot be determined using ICP-AES; however, the proposed microwave extraction procedure appears to be suitable for measurement of Zn, Cu, Pb, Ni, and As using TXRF spectrometry.

📜 SIMILAR VOLUMES

Speciation of elements in lake sediments
Speciation of elements in lake sediments investigated using x-ray fluorescence and inductively coupled plasma atomic emission spectrometry
✍ A. Somogyi; M. Braun; A. Tóth; K. J. Willis 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 253 KB 👁 2 views

Radioisotope-excited energy-dispersive x-ray Ñuorescence (EDXRF) analysis and inductively coupled plasma atomic emission spectrometry (ICP-AES) were used to investigate the speciation of elements in sediment samples collected from a peat bog in Hungary. Lake and bog sediments are a mixture of alloge

Analysis of superconductor oxides YBa2Cu
Analysis of superconductor oxides YBa2Cu3O8−x by inductively coupled plasma atomic emission spectrometry and complexometric titration
✍ Lilli Paama; Paavo Peramäki; Lauri H.J. Lajunen 📂 Article 📅 1996 🏛 Elsevier Science 🌐 English ⚖ 367 KB

The elemental composition of superconductor oxides YBa2Cu308\_x were determined by inductively coupled plasma atomic emission spectrometry (ICP-AES) and complexometric titration. Samples were dissolved in dilute HCl. A sequential PU 7000 Philips inductively coupled plasma atomic emission spectromete

Multi-element Analysis of Food by Microw
Multi-element Analysis of Food by Microwave Digestion and Inductively Coupled Plasma-Atomic Emission Spectrometry
✍ Scott P. Dolan; Stephen G. Capar 📂 Article 📅 2002 🏛 Elsevier Science 🌐 English ⚖ 196 KB

A microwave digestion procedure for multi-elemental analysis of food was developed using one program to digest a variety of food matrices at the same time. A single program was enabled by an analytical portion mass based on the food's energy content calculated from macronutrient data (fat, protein a

Multi-element analysis of fine roots of
Multi-element analysis of fine roots of Scots pine by total reflection x-ray fluorescence spectrometry
✍ Marie Olsson; Arturs Viksna; Heljä-Sisko Helmisaari 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 54 KB 👁 2 views

The aim of this work was to investigate whether total reflection x-ray fluorescence (TXRF) is a satisfactory technique for the determination of trace element concentrations in fine roots. Fine roots in diameter classes <1 and 1-2 mm from Scots pine (Pinus sylvestris L.) were used. The roots were col

Comparison between proton-induced x-ray
Comparison between proton-induced x-ray emission (PIXE) and total reflection x-ray fluorescence (TXRF) spectrometry for the elemental analysis of human amniotic fluid
✍ J. A. Liendo; A. C. González; C. Castelli; J. Gómez; J. Jiménez; L. Marcó; L. Sa 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 124 KB 👁 2 views

A comparison between use of proton-induced x-ray emission (PIXE) and total reÑection x-ray Ñuorescence (TXRF) techniques in relation to the elemental analysis of amniotic Ñuid (AF) was carried out by measuring the concentrations of Cl, K, Ca, Fe, Cu, Zn and Br. For 10 AF samples analyzed, the agreem

Comparison of shallow depth profiles of
Comparison of shallow depth profiles of cobalt-implanted Si wafers determined by total reflection x-ray fluorescence analysis after repeated stratified etching and by rutherford backscattering spectrometry
✍ Klockenkämper, R.; von Bohlen, A.; Becker, H. W.; Palmetshofer, L. 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 94 KB 👁 2 views

Thin and shallow layers of some 50-150 nm were produced by ion implantation of Co ions in Si wafers and afterwards characterized by concentration-depth profiling. Two methods were applied for that purpose: a novel method combining a stepwise wet-chemical etching of an implanted wafer with total refl