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Analysis of a two-unit repairable system with random inspection subject to two types of failure : R. Subramanyam Naidu and M. N. Gopalan, Microelectron. Reliab.23 (3), 449 (1983)


Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
260 KB
Volume
24
Category
Article
ISSN
0026-2714

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