Analysis of a two-dimensional invariant line interface for the case of a general transformation strain and application to thin-film interfaces

✍ Scribed by S.Q Xiao; J.M Howe

• Publisher: Elsevier Science
• Year: 2000
• Tongue: English
• Weight: 274 KB
• Volume: 48
• Category: Article
• ISSN: 1359-6454
• DOI: 10.1016/s1359-6454(00)00116-6