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Analysis and simulation of diffractive imaging field in thick film photoresist by using angular spectrum theory

✍ Scribed by Tang Xionggui; Gao Fuhua; Guo Yongkang; Du Jinglei; Liu Shijie; Gao Feng


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
522 KB
Volume
244
Category
Article
ISSN
0030-4018

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