✦ LIBER ✦
Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment
✍ Scribed by Lee, Y.J.; Kane, T.; Lim, J.-J.; Schiano, L.; Kim, Y.-B.; Meyer, F.J.; Lombardi, F.; Max, S.
- Book ID
- 114629451
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 390 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0018-9456
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