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Analyses of dielectric breakdown in samples and components : R. J. Onufer, C. E. Frahme and D. A. Lupfer, Proc. 1967 Electron. Compon. Conf., Washington DC, p. 335

Publisher: Elsevier Science
Year: 1968
Tongue: English
Weight: 101 KB
Volume: 7
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(68)90025-5

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