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Analogously tunable delay line for on-chip measurements with sub-picosecond resolution in 90 nm CMOS

✍ Scribed by Schidl, S.; Schweiger, K.; Gaberl, W.; Zimmermann, H.


Book ID
125546182
Publisher
The Institution of Electrical Engineers
Year
2012
Tongue
English
Weight
195 KB
Volume
48
Category
Article
ISSN
0013-5194

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