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An XRF method for the determination of the efficiency of Si(Li) detectors in an extended-source geometry by using thick specimens

✍ Scribed by S.M. Tang; P. Kump; C.T. Yap; M.G. Bilal


Publisher
Elsevier Science
Year
1985
Tongue
English
Weight
264 KB
Volume
241
Category
Article
ISSN
0168-9002

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