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An XPS study of the Ar+-induced reduction of Ni2+ in NiO and Ni-Si oxide systems

✍ Scribed by A.R. González-Elipe; R. Alvarez; J.P. Holgado; J.P. Espinos; G. Munuera; J.M. Sanz

Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
666 KB
Volume
51
Category
Article
ISSN
0169-4332

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