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An XPS study of interactions in thin films containing a noble metal with valence-invariant and reducible oxides

✍ Scribed by M. Shelef; L.P. Haack; R.E. Soltis; J.E. Devries; E.M. Logothetis

Book ID: 113180545
Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 959 KB
Volume: 137
Category: Article
ISSN: 0021-9517
DOI: 10.1016/0021-9517(92)90143-6

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