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An X-ray study of residual stresses and bending stresses in free-standing Nb/Nb5Si3 microlaminates

✍ Scribed by C.H. Shang; D. Van Heerden; A.J. Gavens; T.P. Weihs

Publisher: Elsevier Science
Year: 2000
Tongue: English
Weight: 854 KB
Volume: 48
Category: Article
ISSN: 1359-6454
DOI: 10.1016/s1359-6454(00)00125-7

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