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An X-ray study of domain structure and stress in Pd2Si films at Pd-Si interfaces

✍ Scribed by Haydn Chen; G.E. White; S.R. Stock; P.S. Ho

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 492 KB
Volume: 93
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(82)90101-8

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