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An X-ray photoelectron diffraction structural characterisation of epitaxial ultrathin RuO2/TiO2(110) films obtained by decomposition of Ru3(CO)12

✍ Scribed by G.A Rizzi; M Sambi; A Magrin; G Granozzi


Book ID
117214641
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
245 KB
Volume
454-456
Category
Article
ISSN
0039-6028

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