✦ LIBER ✦

An X-ray diffraction technique for analyzing structural defects including microstrain in nitride materials

✍ Scribed by Q.S. Paduano; D.W. Weyburne; A.J. Drehman

Book ID: 108166170
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 616 KB
Volume: 318
Category: Article
ISSN: 0022-0248
DOI: 10.1016/j.jcrysgro.2010.10.019

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

An X-ray diffraction technique for analy

An X-ray diffraction technique for analyzing basal-plane stacking faults in GaN

✍ Paduano, Qing S. ;Weyburne, David W. ;Drehman, Alvin J. 📂 Article 📅 2010 🏛 John Wiley and Sons 🌐 English ⚖ 490 KB

## Abstract An X‐ray diffraction (XRD) technique for analyzing basal‐plane stacking faults (BSFs) is introduced and tested on GaN. The analysis considers the coexistence of multiple X‐ray broadening terms including tilt, twist, limited coherence length, and inhomogeneous strain. By measuring and fi

[Springer Series in Materials Science] C

[Springer Series in Materials Science] Crystallography and the World of Symmetry Volume 113 || Experimental Methods for Structure Analysis: X-Ray Diffraction Techniques

✍ , 📂 Article 📅 2008 🏛 Springer Berlin Heidelberg ⚖ 666 KB