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An X-ray diffraction study of the structural properties of thick relaxed (100) InGaAs/GaAs heterostructures

✍ Scribed by F. Riesz; J. Z. Domagala; Á. Nemcsics

Publisher
John Wiley and Sons
Year
2005
Tongue
English
Weight
452 KB
Volume
2
Category
Article
ISSN
1862-6351

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