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An X-ray Diffraction Study of the Size Effect on a Crystalline Solid Solution of Semiconductor System Ge0.2Si0.8

✍ Scribed by Dr. S. K. Mohanlal; C. Sanjeeviraja

Publisher: John Wiley and Sons
Year: 1986
Tongue: English
Weight: 243 KB
Volume: 21
Category: Article
ISSN: 0232-1300
DOI: 10.1002/crat.2170210530

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