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An X-ray diffraction study of the crystallization characteristics of amorphous CoB ribbons

✍ Scribed by Tu Guo-hua; Chen Wan-Rong


Publisher
Elsevier Science
Year
1988
Weight
211 KB
Volume
97
Category
Article
ISSN
0025-5416

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An instrument for the X-ray diffraction
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An easily constructed reciprocating device for the X-ray examination of working electrodes is described, and an example is given of its application to the study of electrodeposited layers. RCsum&Un dispositif facile ii assembler permet d'obtenir in situ les intensitks relatives des diagrammes de di