๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip

โœ Scribed by Carrasco, J.A.; Sune, V.


Book ID
115534424
Publisher
IEEE
Year
2009
Tongue
English
Weight
659 KB
Volume
17
Category
Article
ISSN
1063-8210

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES