An overview of IC failure analysis : D. R. Jones and M. Woodward. New Electron., 45 (April 1988)

• Book ID: 103286460
• Publisher: Elsevier Science
• Year: 1989
• Tongue: English
• Weight: 125 KB
• Volume: 29
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(89)90377-6