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An optimal designed degradation experiment for reliability improvement

✍ Scribed by Hong-Fwu Yu; Chih-Hua Chiao

Book ID: 114668162
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 537 KB
Volume: 51
Category: Article
ISSN: 0018-9529
DOI: 10.1109/tr.2002.804493

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