## Abstract Timeβofβflight secondary ion mass spectroscopy (ToFβSIMS) and xβray photoelectron spectroscopy (XPS) have been employed to study the plasma surface oxidation of poly(ether etherketone) (PEEK). The positive and negative ion ToFβSIM spectra obtained from a cleaned PEEK surface were easily
β¦ LIBER β¦
An investigation of the surface chemical homogeneity of plasma oxidised poly(ether etherketone)
β Scribed by A.P. Ameen
- Publisher
- Elsevier Science
- Year
- 1996
- Tongue
- English
- Weight
- 557 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0141-3910
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