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An investigation of the mass spectra of secondary ions ejected from the single crystal surface of semiconductors

โœ Scribed by A.G. Koval'; V.N. Mel'Nikov; Yu.V. Enukov


Publisher
Elsevier Science
Year
1976
Weight
272 KB
Volume
132
Category
Article
ISSN
0029-554X

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An investigation of the SO2Ag surface re
โœ M. Barber; P. Sharpe; J.C. Vickerman ๐Ÿ“‚ Article ๐Ÿ“… 1974 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 245 KB

The interaction of SO\* and of SOz + O2 mixtures with Ag surfaces has been investigated using secondary ion mass spectroscopy. The SOz/Ag system gave spectra which were largely composed of AgSO:, AgSOz and AgzS+ ions, indicative of the formation of S and SO4 species in the reaction. In the case of